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X-Ray Diffraction (Flexibility and Modularity without limits) - Globex Marketing Company Ltd.

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X-Ray Diffraction (Flexibility and Modularity without limits)

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Description

X-Ray Diffraction (Flexibility and Modularity without limits) product detail-

Explorer is a multi purpose – Theta/Theta – high resolution diffractometer which, thanks to its direct drive torque motors, offers top performances in many analytical areas, from phase analysis to determination of microstructural properties on bulk or thin film materials. 

Thanks to its modularity and the wide range of accessories and attachments available, EXPLORER allows to perform measurement in different configurations: traditional X-Ray Powder Diffraction (XPD), Reflectometry (XRR), Grazing Incidence X-Ray Diffraction (GIXRD), High Resolution X-Ray Diffraction (HRXRD), Total X-Ray Fluorescence (TXRF), Residual Stress and Texture X-Ray Diffraction. 

The modularity and the flexibility of the GNR X-Ray Explorer allows to start with an entry-level system which can be upgraded to meet new requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy all the analytical needs.

With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phases quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.

  • Routine Cystalline phase identification and quantification
  • Crystallite size – lattice strain and crystallinity calculation
  • Polymorph screening and crystal structure analysis 
  • Residual Stress and Retained Austenite Quantification 
  • Thin Films, Depth Profiling and non ambient analysis 
  • Phase Transition monitorin, tecture and preferred orientations 

 

The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.

The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).

Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers. 

The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.